20 x7s formulations are called temperature stable ceramics and fall into eia class ii materials. its temperature variation of capacitance is within 22% from C55c to +125c. this capacitance change is non-linear. capacitance for x7s varies under the influence of electrical operating conditions such as voltage and frequency. x7s dielectric chip usage covers the broad spectrum of industrial applications where known changes in capacitance due to applied voltages are acceptable. x7s dielectric general specifications part number (see page 2 for complete part number explanation) general description typical electrical characteristics 1206 size (l" x w") z voltage 4 = 4v 6 = 6.3v z = 10v y = 16v 3 = 25v 5 = 50v 1 = 100v 2 = 200v z dielectric z = x7s 105 capacitance code (in pf) 2 sig. digits + number of zeros m capacitance tolerance k = 10% m = 20% a failure rate a = n/a t terminations t = plated ni and sn 2 packaging 2 = 7" reel 4 = 13" reel 7 = bulk cass. a special code a = std. product % capacitance +10 +20 +30 0 -10 -20 -30 1khz 10 khz 100 khz 1 mhz 10 mhz frequency capacitance vs. frequency insulation resistance (ohm-farads) 1,000 10,000 100 0 0 20 120 40 60 80 temperature c insulation resistance vs temperature 100 impedance, 10 100 1000 frequency, mhz variation of impedance with cap value impedance vs. frequency 1,000 pf vs. 10,000 pf - x7s 0805 0.10 0.01 1.00 1,000 pf 10,000 pf 10.00 impedance, 110 100 1,000 frequency, mhz variation of impedance with chip size impedance vs. frequency 100,000 pf - x7s 0.1 .01 1.0 1206 0805 10 1210 impedance, 110 100 1,000 frequency, mhz variation of impedance with chip size impedance vs. frequency 10,000 pf - x7s 0.1 .01 1.0 1206 0805 10 1210 10 5 0 -5 -10 -15 -20 -25 -60 -40 -20 0 20 40 temperature ( c) % cap change 60 80 100 120 140 x7s dielectric typical temperature coefficient note: contact factory for availability of tolerance options for specific part numbers.
21 x7s dielectric specifications and test methods parameter/test x7s specification limits measuring conditions operating temperature range -55oc to +125oc temperature cycle chamber capacitance within specified tolerance 2.5% for 50v dc rating freq.: 1.0 khz 10% dissipation factor 3.0% for 25v dc rating voltage: 1.0vrms .2v 3.5% for 16v dc rating for cap > 10 f, 0.5vrms @ 120hz 5.0% for 10v dc rating insulation resistance 100,000m or 1000m - f, charge device with rated voltage for whichever is less 120 5 secs @ room temp/humidity charge device with 300% of rated voltage for dielectric strength no breakdown or visual defects 1-5 seconds, w/charge and discharge current limited to 50 ma (max) appearance no defects deflection: 2mm capacitance test time: 30 seconds resistance to variation 12% flexure dissipation meets initial values (as above) stresses factor insulation initial value x 0.3 resistance solderability 95% of each terminal should be covered dip device in eutectic solder at 230 5oc with fresh solder for 5.0 0.5 seconds appearance no defects, <25% leaching of either end terminal capacitance variation 7.5% dip device in eutectic solder at 260oc for 60 dissipation meets initial values (as above) seconds. store at room temperature for 24 2 resistance to factor hours before measuring electrical properties. solder heat insulation meets initial values (as above) resistance dielectric meets initial values (as above) strength appearance no visual defects step 1: -55oc 2o 30 3 minutes capacitance variation 7.5% step 2: room temp 3 minutes dissipation meets initial values (as above) step 3: +125oc 2o 30 3 minutes thermal factor shock insulation meets initial values (as above) step 4: room temp 3 minutes resistance dielectric meets initial values (as above) repeat for 5 cycles and measure after strength 24 2 hours at room temperature appearance no visual defects capacitance variation 12.5% dissipation initial value x 2.0 (see above) load life factor insulation initial value x 0.3 (see above) resistance dielectric meets initial values (as above) strength appearance no visual defects capacitance variation 12.5% load dissipation initial value x 2.0 (see above) humidity factor insulation initial value x 0.3 (see above) resistance dielectric meets initial values (as above) strength charge device with 1.5 rated voltage ( 10v) in test chamber set at 125oc 2oc for 1000 hours (+48, -0) remove from test chamber and stabilize at room temperature for 24 2 hours before measuring. store in a test chamber set at 85oc 2oc/ 85% 5% relative humidity for 1000 hours (+48, -0) with rated voltage applied. remove from chamber and stabilize at room temperature and humidity for 24 2 hours before measuring. 1mm/sec 90 mm
22 x7s dielectric capacitance range preferred sizes are shaded size 0402 0603 0805 1206 1210 soldering reflow/wave reflow/wave reflow/wave reflow/wave reflow only packaging all paper all paper paper/embossed paper/embossed paper/embossed (l) length mm 1.00 0.10 1.60 0.15 2.01 0.20 3.20 0.20 3.20 0.20 (in.) (0.040 0.004) (0.063 0.006) (0.079 0.008) (0.126 0.008) (0.126 0.008) (w) width mm 0.50 0.10 0.81 0.15 1.25 0.20 1.60 0.20 2.50 0.20 (in.) (0.020 0.004) (0.032 0.006) (0.049 0.008) (0.063 0.008) (0.098 0.008) (t) terminal mm 0.25 0.15 0.35 0.15 0.50 0.25 0.50 0.25 0.50 0.25 (in.) (0.010 0.006) (0.014 0.006) (0.020 0.010) (0.020 0.010) (0.020 0.010) wvdc 6.3 6.3 25 4 6.3 10 6.3 cap 100 (pf) 150 220 330 470 680 1000 1500 2200 3300 4700 6800 cap 0.010 (f 0.015 0.022 0.033 c 0.047 c 0.068 c 0.10 c 0.15 0.22 g 0.33 g 0.47 g 0.68 g 1.0 g 1.5 n q 2.2 n q 3.3 n q 4.7 n q q 10 22 z 47 100 wvdc 6.3 6.3 25 4 6.3 10 6.3 size 0402 0603 0805 1206 1210 l w t t letter acegjkmnpqxyz max. 0.33 0.56 0.71 0.90 0.94 1.02 1.27 1.40 1.52 1.78 2.29 2.54 2.79 thickness (0.013) (0.022) (0.028) (0.035) (0.037) (0.040) (0.050) (0.055) (0.060) (0.070) (0.090) (0.100) (0.110) paper embossed
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